Capturing fast switching waveforms
SiC and GaN devices switch at nanosecond speeds. Measurement chains need high bandwidth, fast response, and waveform fidelity.
Semiconductor Testing
Support for SiC and GaN power device characterization, module validation, and gate-drive debugging with wide-bandwidth probes, precision current sensing, and stable measurement chains.
Testing Challenges
Synchronization in double-pulse testing
Accurate loss measurement requires tightly synchronized voltage, current, and timing channels across the test setup.
Managing high dv/dt and EMI
Wide-bandgap test environments create strong dv/dt and electromagnetic noise. Stable probing and system-level grounding are essential.
Measurement support for wide-bandgap power devices
As SiC and GaN adoption accelerates, test engineers face steeper requirements for switching-speed fidelity, timing accuracy, and noise immunity in device and module characterization.
Accuracy first
Measurement tools must remain dependable under demanding development and validation conditions.
Built for real test benches
The measurement chain is designed for practical lab, production, and troubleshooting environments.
Long-term technical support
Selection guidance, usage support, and maintenance services help reduce lifecycle friction.
Typical Test Scenarios
SiC / GaN double-pulse testing
Validate turn-on, turn-off, reverse recovery, and switching losses for power device characterization.
Power module switching validation
Evaluate module behavior under high-voltage, high-frequency conditions with synchronized voltage and current measurements.
Gate-drive debugging and timing
Observe gate-drive signals, voltage, and current waveforms to assess delay, oscillation, and protection behavior.
High dv/dt noise-immune measurement
Maintain stable voltage and current measurement chains in strong-noise, high-switching-speed environments.